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DATA SHEET DATA SHEET
SILICON TRANSISTOR
2SC3585
MICROWAVE LOW NOISE AMPLIFIER NPN SILICON EPITAXIAL TRANSISOR
DESCRIPTION
The 2SC3585 is an NPN epitaxial silicon transistor designed for use in low-noise and small signal amplifiers from VHF band to UHF band. The 2SC3585 features excellent power gain with very low-noise figures. The 2SC3585 employs direct nitride passivated base surface process (DNP process) which is an NEC proprietary new fabrication technique which provides excellent noise figures at high current values. This allows excellent associated gain and very wide dynamic range.
PACKAGE DIMENSIONS (Units: mm)
2.80.2
0.4 -0.05
+0.1
1.5
0.65 -0.15
+0.1
0.95 0.95
FEATURES
* NF * Ga 1.8 dB TYP. 9 dB TYP. @f = 2.0 GHz @f = 2.0 GHz
2.90.2
2
ABSOLUTE MAXIMUM RATINGS (TA = 25 C)
Collector to Base Voltage Collector to Emitter Voltage Emitter to Base Voltage Collector Current Total Power Dissipation Junction Temperature Storage Temperature VCBO VCEO VEBO IC PT Tj Tstg 20 10 1.5 35 200 150 65 to +150 V V V mA mW
C C
0.3
Marking
1.1 to 1.4
PIN CONNECTIONS 1. Emitter 2. Base 3. Collector
ELECTRICAL CHARACTERISTICS (TA = 25 C)
CHARACTERISTIC Collector Cutoff Current Emitter Cutoff Current DC Current Gain Gain Bandwidth Product Feed-Back Capacitance Insertion Power Gain Maximum Available Gain Noise Figure SYMBOL ICBO IEBO hFE * fT Cre ** 50 100 10 0.3
2
MIN.
TYP.
MAX. 1.0 1.0 250
UNIT
TEST CONDITIONS VCB = 10 V, IE = 0 VEB = 1 V, IC = 0 VCE = 6 V, IC = 10 mA
A A
GHz 0.8 pF dB dB 3.0 dB
VCE = 6 V, IC = 10 mA VCB = 10 V, IE = 0, f = 1.0 MHz VCE = 6 V, IC = 10 mA, f = 2.0 GHz VCE = 6 V, IC = 10 mA, f = 2.0 GHz VCE = 6 V, IC = 5 mA, f = 2.0 GHz
S21e
MAG NF
6.0
8.0 10 1.8
* Pulse Measurement PW 350 s, Duty Cycle 2 % ** The emitter terminal and the case shall be connected to the gurad terminal of the three-terminal capacitance bridge. hFE Classification
Class Marking hFE R43/Q * R43 50 to 100 R44/R * R44 80 to 160 R45/S * R45 125 to 250 * Old Specification / New Specification
Document No. P10361EJ4V1DS00 (4th edition) Date Published March 1997 N Printed in Japan
0 to 0.1
(c)
0.16 -0.06
+0.1
0.4 -0.05
+0.1
1
3
1984
2SC3585
TYPICAL CHARACTERISTICS (TA = 25 C)
TOTAL POWER DISSIPATION vs. AMBIENT TEMPERATURE 3 PT-Total Power Dissipation-W Free Air Cre-Feed-back Capacitance-pF 200 f = 1.0 MHz 2 FEED-BACK CAPACITANCE vs. COLLECTOR TO BASE VOLTAGE
1 0.7 0.5 0.3 0.2
100
0
50
100
150 0.1 1
TA-Ambient Temperature-C 2 3 5 7 10 VCB-Collector to Base Voltage-V INSERTION GAIN vs. COLLECTOR CURRENT 10 VCE = 6 V 8 VCE = 6 V f = 2.0 GHz |S21e|2-Insertion Gain-dB 20 30
DC CURRENT GAIN vs. COLLECTOR CURRENT 200
100 hFE-DC Current Gain
6
50
4
20
2 10 0.5
1
5
10
50
IC-Collector Current-mA GAIN BANDWIDTH PRODUCT vs. COLLECTOR CURRENT 30 VCE = 6 V fT-Gain Bandwidth Product-MHz 20 MAG-Maximum Available Gain-dB |S21e|2-Insertion Gain -dB
0 1
2
3 5 7 10 IC-Collector Current-mA
20
30
INSERTION GAIN, MAXIMUM AVAILABLE GAIN vs. FREQUENCY 20 VCE = 6 V IC = 10 mA 16 MAG |S21e| 12
2
10 7 5 3 2
8
4
1
2
3 5 7 10 IC-Collector Current-mA
20
30
0 0.1
0.2
0.3 0.5 7.0 1.0 f-Frequency-GHz
2.0 3.0
2
2SC3585
NOISE FIGURE vs. COLLECTOR CURRENT 7 6 NF-Noise Figure-dB 5 4 3 2 1 0 0.5 VCE = 6 V f = 2.0 GHz
1
5
10
50 70
IC-Collector Current-mA
S-PARAMETER
VCE = 6.0 V, IC = 3.0 mA, ZO = 50
f (MHz) 200 400 600 800 1000 1200 1400 1600 1800 2000
S11
0.858 0.724 0.580 0.457 0.362 0.304 0.232 0.179 0.147 0.108
S11 23.1 40.6 51.1 58.9 65.6 73.1 82.2 84.9 88.2 104.1
S21
8.499 6.923 5.951 4.615 4.134 3.412 3.180 2.763 2.726 2.378
S21
153.3 131.6 118.4 104.9 98.0 88.9 82.0 75.7 70.5 64.9
S12
0.030 0.060 0.080 0.099 0.106 0.129 0.148 0.154 0.188 0.197
S12
46.5 58.7 60.3 60.2 61.2 61.1 60.1 59.5 58.7 56.8
S22
0.905 0.826 0.749 0.666 0.614 0.574 0.542 0.514 0.483 0.455
S22 13.5 21.2 27.0 28.6 30.1 30.0 31.7 35.2 40.1 42.6
VCE = 6.0 V, IC = 10.0 mA, ZO = 50
f (MHz) 200 400 600 800 1000 1200 1400 1600 1800 2000
S11
0.613 0.406 0.285 0.214 0.156 0.130 0.105 0.065 0.042 0.018
S11 37.0 53.6 56.0 57.6 58.1 54.2 56.5 55.0 48.9 65.6
S21
16.141 10.096 7.640 5.564 4.787 3.876 3.573 3.058 2.997 2.590
S21
133.9 111.5 101.4 90.7 86.0 79.3 74.0 69.4 65.3 60.7
S12
0.021 0.053 0.064 0.089 0.095 0.119 0.141 0.158 0.178 0.202
S12
52.5 70.6 73.0 71.7 70.6 70.3 68.3 68.9 66.5 66.2
S22
0.781 0.651 0.590 0.548 0.526 0.506 0.489 0.470 0.439 0.426
S22 19.4 22.4 24.0 22.8 23.3 22.1 24.8 27.9 31.4 36.5
3
2SC3585
S-PARAMETER
S11e, S22e-FREQUENCY CONDITION VCE = 6 V 200 MHz Step
8 0.0 2 0.4
0.9
1.0
0.8
1.2
9 0.0 1 0.4
0.10 0.40 110
0.7
0.11 0.39 100
0.12 0.38
0.13 0.37
90
0.14 0.36 80
0.15 0.35
70
1.4
0.1 6 0.3 4
0.6
0.
THS 0 0.01 0.49 0.02 TOWARD 0.48 0 0.49 0.0 GENE 0.01 7 0.48 3 RA 0.4 0.02 D LOAD TION COEF WAR FLEC FCIENT 0.4 0.0TOR 6 IN DE 7 .03THS TO GLE OF RE 0G 4 GRE AN 0.4 0.4 ES LEN-160 0 4E 6 0 .0 0.0 AV 5 W 15 0.4 5 0.4 5 50 0 -1 5 0.0 0. 4 0 POS .4 6 0.1 NT 14 0.4 6 00 E ITIV 40 ON 0 ER 4 MP 0. -1 EA CO C
0.
5
07 43 0. 0 13
1.6
12
0
6 00
1.8
0.1 0.3 7 3
0.2
0.
2.0
50
0. 18 32
19 0. 31 0.
( -Z-+-J-XTANCE CO ) MPO
N
T EN
0.4
0 0.2 0 0.3
40
O
WAVELEN G
0 1.
2.0 GHz
0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.2 1.4 1.6 1.8 2.0 3.0 4.0 5.0 10 20
REACTANCE COMPONENT R ---- 0.2 ZO
0.1
0.4
IC = 3 mA
0.6
0
0.2
0.
8
E NC TA X - AC -J -O RE --Z
0.3
(
0.
4
E IV AT
0.
5
2.0
0.6
1.8
1.6
0.7
0.8
1.4
0.9
1.2
1.0
S21e-FREQUENCY CONDITION 90 120
VCE = 6 V
S12e-FREQUENCY
60
120 IC = 10 mA
0.2 GHz 150 IC = 3 mA
IC = 10 mA S21e 1.0 GHz 30 150 S12e IC = 3 mA 30
180
2.0 GHz 0.2 GHz 1.0 GHz 2.0 GHz 0 4 8
12
16
0 180 20
-150
-30
-150
-120 -90
-60
-120 -90
4
3.
0
S11e
-5
4.0
)
0.
32
0.
18
0
3 0.3 7
0.1
-6
4 0.3 6 0.1
0
0.35 0.15 -70
0.36 0.14 -80
1.0
1.
0.2 GHz
-4 0
10
2.0
GH
S22e 0.2 GHz
20
z
50
(
)
IC = 10 mA
5.0
0.8
0.8
0.6
0.6
0.37 0.13
0.4
0.4
0.2
0.2
-90
0.38 0.12
0.39 0.11 -100
0.40 0.10
-11
0
0.4 1 0.0 9
-1 2
0.4 0.0 2 8 0
NE G
-1
0. 4 0. 3 07 30
0.
4
0.6
3.
0.8
0
1 0.2 9 0.2 30
0.3
4.0
1.0
6.0
0.24 0.23 0.26 2 0.2 0.27 8 10 0.2 20
0.2
10
0.1
20
50
0.25 0.25
S22e
0
0.26 0.24
-10
0.27 0.23
0.2 8 0.2 2 -20
0 .29 0.2 1 0.3 -3 0.2 0 0 0
0. 0. 31 19
CONDITION 90
VCE = 6 V
60 2.0 GHz
0
0.2 GHz 0 0.04 0.08 0.12 0.16 0.20
-30
-60
2SC3585
[MEMO]
5
2SC3585
[MEMO]
6
2SC3585
[MEMO]
7
2SC3585
No part of this document may be copied or reproduced in any form or by any means without the prior written consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this document. NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from use of a device described herein or any other liability arising from use of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC Corporation or others. While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices, the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety measures in its design, such as redundancy, fire-containment, and anti-failure features. NEC devices are classified into the following three quality grades: "Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a customer designated "quality assurance program" for a specific application. The recommended applications of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device before using it in a particular application. Standard: Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support) Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems or medical equipment for life support, etc. The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books. If customers intend to use NEC devices for applications other than those specified for Standard quality grade, they should contact an NEC sales representative in advance. Anti-radioactive design is not implemented in this product.
M4 96. 5

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